Atomic Force Microscope (AFM)
Introduction of atomic force microscopes (AFM) capable of customized proposals for various systems, from research use to production sites.
Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have models such as "CoreAFM," which features an active vibration isolation mechanism and supports various measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever exchange using dedicated tools. Customization options are available, ranging from small models for research settings to large stage models for production environments, as well as automated systems for quality control. 【Product Lineup (Excerpt)】 ◎ Tabletop Atomic Force Microscope "CoreAFM" ■ Equipped with active vibration isolation and wind protection ■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM" ■ Integrates controller, XY stage, wind protection, and vibration isolation ■ Features a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we offer. You can view detailed information by downloading the PDF.
- Company：日本カンタム・デザイン
- Price：Other
